50MHz Analog- Digital-Oscilloscope HM507

Ref. 3274

 

Specifications:

Vertical Deflection (analog/digital)
Operating modes: Channel I or CH II separate, CH I and II alternate or chopped (0.5MHz), Sum or difference from CH I and ±CH II
XY-Mode: via CH I (X) and CH II (Y)
Frequency range: 2x DC - 50MHz (-3dB)
Rise time, Overshoot: <7ns, ≤ 1%
Deflection coefficient: 14 calibrated steps (1-2-5 sequence) 1mV-2mV/div: ±5% (DC to 10MHz (-3dB)) 5mV-20V/div: ±3% (DC to 50MHz (- 3dB)) with variable >2.5:1(uncal.) to >50V/cm
Input impedance: 1 MΩ II 18pF
Input coupling: DC–AC-GD (ground)
Input voltage: max. 400V (DC + peak AC)

Triggering (analog/digital)
Automatic (peak to peak): ≥ 0.5div, 20Hz – 100MHz Normal with level control: ≥ 0.5div, 0 - 100MHz
Indicator for trigger action: LED
Slope: positive or negative
Sources: CH I or II, alternate CH I and CH II (≥ 0.8div), line (mains) and external Coupling: AC (10Hz - 100MHz), DC (0 - 100MHz), HF (50kHz - 100MHz), LF (0 -1,5kHz)
2nd Triggering (analog mode): normal with level control and slope selection External: ≥ 0,3Vpp (0 - 50MHz) Active TV Sync Separator: Field and Line, pos. and neg.

Horizontal Deflection
Analog
Time coefficients: 22 calibrated steps (1-2-5 sequence), 0.5s/div – 50ns/div (± 3%), with variable >2.5: 1(uncal.) to >1.25s/div X-MAG. x10: up to 10ns/div. (± 5%)
Delay: 140ms – 200ns (variable)
Holdoff time: variable to approx. 10:1
Bandwidth X-Amplifier: 0 - 3MHz (-3dB)
X-Y phase shift: <3° below 120kHz
Digital
Time coefficients: 100s/div – 50ns/div (±2%), 28 cal. steps (1-2-5 sequence)
X-MAG. x10: up to 20ns/div. (± 2%)
Bandwidth X-Amplifier: 0 - 50MHz (-3dB)
X-Y phase shift: <3° below 10MHz

Digital Storage
Operating modes: Refresh, Roll, Single, XY, Envelope, Average, Random-Sampling
Dot Join function: automatic
Max. sample rate, real time: 100MSa/s, 8 bit flash A/D
Max. effective sample rate, random: 2GSa/s
Pre-/Post-Trigger: -75% .... +100% (continuously)
Signal refresh rate: max. 180/s
Memory & display: 3k x 8 bit
Reference memory (EEPROM): 3k x 8 bit
Resolution (samples/div) in Yt mode: X = 200/div, Y = 25/div
Resolution (samples/div) in XY mode: X = 25/div, Y = 25/div

Operation / Display
Manual / Autoset: front panel switches / autom. parameter selection
Save/Recall: 9 user defined instrument settings Readout: display of instrument settings and measuring results
auto measurement: frequency/cycle, Vdc, Vpp, Vp+, Vp-
Cursor measurement (analog, digital): ΔV, Δt or 1/Δt
(frequ.), gain, rise time, ratio X, ratio Y, V to GND, phase angle
Cursor measurement (digital): pulse count, search (peak – peak, peak+, peak-), mean value (avm), effective value (rms)
Frequency counter: 4 digit (0.01% ±1 digit) 0.5Hz -100MHz
Interface (standard fitting): RS-232 (for instrument control and signal data) Option: data transfer via glass fiber: HZ70; Interface: HO79-6

Component Tester
Test voltage, frequency: approx. 7Vrms (open circuit), approx. 50Hz
Test current: approx. 7mArms (short circuit) One test lead is grounded (Safety Earth)

General Information
CRT: 8x10cm, internal graticule
Acceleration voltage: approx. 2kV
Z-Input (Intens. modulation, analog): max. +5V (TTL)
Calibrator (square wave): 0.2V ±1 %, ≈ 1 Hz - 1 MHz (tr <4ns)
Line voltage: 100-240V AC ±10%, 50/60Hz
Power consumption: approx. 42Watt at 50Hz
Min./Max. ambient temperature: 10°C...+40°C
Protective system: Safety class I (EN 61 010, IEC 1010-1)
Weight: ca. 6.0kg, Color: techno-brown
Cabinet: W 285, H 125, D 380 mm

Accessories supplied: Operators Manual and PC Software on CD-ROM, 2 Probes 1:1/10:1 and Line Cord.

    The HM507 features 50MHz bandwidth capability in analog and digital mode, which is unique in its price range. According to the measurement task, the user can select between the advantages of analog or digital by pressing one pushbutton. The CRT display with its extremely high resolution, offers unsurpassed signal display quality in combination with an unmatched display update rate. In digital mode each signal can be displayed with 2000 samples (200 samples/div). The high X resolution also has the effect that, in comparision with LC and raster scan displays, the sampling rate in each comparable time base setting is significantly higher. This reduces the danger of alias signal display. The ability to record even very low frequency signals down to 1mHz and single events, together with Pre or Post Trigger, are examples of the advantages of digital mode. Additionally in digital mode, signal processing (average, envelope) can be performed as well as signal documentation in combination with external devices (e.g. PC) via the built in RS-232 interface. A suitable software program is supplied with the scope. In addition to real time sampling, random sampling is now available too; the latter function allows you to record repetitive signals up to 50MHz. The demands for a distortion free “probe tip to screen“ signal display are met by the low noise, 8 bit flash A/D converters, avoiding noise problems typical for CCD and analog array converters. Two non volatile reference memories allow the comparison of signals with those already stored in memory. Autoset significantly eases instrument operation; briefly pressing this button automatically optimises the instrument setting for almost any signal, and manual adjustments are only required for special cases (e.g. complex signals). Save/Recall allows you to store and recall 9 different instrument settings in a non volatile memory.

    Front panel settings and selected features are alphanumerically displayed on the screen (Readout). For example the results of cursor independent automatic measurement of frequency, period, dc- or ac voltages. Voltage, time, frequency, phase angle, gain, rise time, ratio X and ratio Y can be determined by manual cursor measurement in analog and digital mode. In the latter
mode cursor supported rms and mean value measurement as well as a count function are available too. Probe factor input (x1 and x10) enables the correct display of deflection coefficients and voltages, without annoying calculation. In its class the HM507 offers unique characteristics for measurement and documentation.